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IEC 61606 is the principal international standard governing measurement methods for audio and audio-visual equipment. Part 3 (IEC 61606-3:2008) specifically addresses measurement methods for DVD players, home theater systems, and similar digital audio-visual devices. This standard is indispensable for audio engineers, product designers, and quality assurance professionals who need to objectively characterize the performance of consumer and professional audio equipment. It defines consistent, reproducible measurement techniques that enable meaningful comparison across different products and manufacturers.
IEC 61606-3 applies to DVD players, DVD recorders, home theater systems, digital television receivers, and multimedia devices with audio output capabilities. The standard covers both analog and digital audio outputs, including electrical (RCA/phono, XLR), optical (TOSLINK), and coaxial (S/PDIF) interfaces. It defines measurement conditions, reference levels, weighting filters, and test signals for comprehensive audio performance characterization.
The measurement framework is organized around several fundamental audio quality parameters. The standard specifies that all measurements shall be performed under specified ambient conditions (temperature 15–35°C, relative humidity 25–75%) after a warm-up period sufficient for the equipment to reach thermal equilibrium, typically 30 minutes. All test signals are defined with precise amplitude, frequency, and duration characteristics to ensure repeatability across different laboratories.
IEC 61606-3 defines the following essential measurement parameters for audio-visual equipment:
Frequency Response: Measured using a swept sine wave or stepped frequency tones across the audio band (20 Hz to 20 kHz for consumer equipment, extended to 96 kHz for high-resolution audio). The standard specifies that the measurement bandwidth must be at least 10 times the highest frequency of interest. Results are expressed in dB relative to the reference level at 1 kHz. The allowable deviation is typically within +0.5 dB/−1.0 dB for high-fidelity equipment.
Signal-to-Noise Ratio (SNR): Measured with a full-scale digital signal (0 dBFS) at 1 kHz, with the output measured using A-weighting and CCIR-weighting (ITU-R 468) filters. The standard requires that the noise floor be measured over a specified bandwidth (22 Hz to 22 kHz for consumer applications, 4 Hz to 24 kHz for professional applications). SNR values above 90 dBA are considered excellent for consumer equipment, while professional equipment typically exceeds 110 dBA.
Total Harmonic Distortion plus Noise (THD+N): This is the ratio of the RMS value of the combined harmonic distortion products and noise to the RMS value of the fundamental signal. Per IEC 61606-3, THD+N is measured at multiple frequencies (typically 40 Hz, 1 kHz, 6.3 kHz, and 15 kHz) and at multiple signal levels (−20 dBFS, −10 dBFS, and 0 dBFS). The measurement bandwidth is specified as 22 Hz to 80 kHz (unweighted) to capture all relevant distortion products.
Dynamic Range: Defined as the difference between the maximum output level (0 dBFS) and the minimum output level (A-weighted noise floor when encoding a −60 dBFS signal). This measurement reveals the system’s ability to reproduce quiet passages in the presence of a signal — a demanding test of DAC linearity and noise modulation. High-performance systems achieve dynamic range exceeding 110 dB.
| Parameter | Test Signal | Measurement Bandwidth | Typical High-Performance Target |
|---|---|---|---|
| Frequency Response | Swept sine, −20 dBFS | 20 Hz – 20 kHz | ±0.2 dB (20 Hz–20 kHz) |
| SNR (A-weighted) | 1 kHz, 0 dBFS | 22 Hz – 22 kHz | > 110 dBA |
| THD+N | 1 kHz, −1 dBFS | 22 Hz – 80 kHz | < 0.001% (−100 dB) |
| Dynamic Range | 1 kHz, −60 dBFS | A-weighted | > 110 dB |
| Channel Separation | 1 kHz, 0 dBFS | 22 Hz – 22 kHz | > 90 dB |
| Output Level | 1 kHz, 0 dBFS | — | 2.0 Vrms ± 0.1 V |
IEC 61606-3 defines a comprehensive suite of test signals for various measurement purposes. The digital test signals are specified according to the IEC 60958 (S/PDIF) standard format. Critical test signals include:
Undithered Sine Wave: Used for frequency response measurement and basic level calibration. The undithered sine wave at −20 dBFS is the standard reference signal for establishing the output reference level (typically 2.0 Vrms for consumer equipment).
Dithered Sine Wave: Used for low-level measurements including dynamic range and linearity testing. The dither signal (typically triangular probability density function, peak-to-peak amplitude of 1 LSB) decorrelates quantization noise from the signal, allowing accurate measurement of low-level performance. Per IEC 61606-3, the dither type and amplitude must be specified in the test report.
Multitone Test Signal: Comprising multiple simultaneous sine wave components, this signal enables rapid assessment of intermodulation distortion behavior. The standard recommends a 32-tone signal with logarithmically spaced frequencies from 40 Hz to 18 kHz, each at equal amplitude with random phase to minimize crest factor.
IEC 61606-3 addresses jitter measurement for digital audio interfaces, recognizing that timing errors in the digital transmission path can degrade audio quality even before the signal reaches the DAC. The standard defines two classes of jitter measurement: intrinsic jitter (generated by the device itself) and jitter tolerance (the device’s ability to accept jittered input signals without performance degradation).
Intrinsic jitter is measured at the digital output using a jitter measurement system conforming to IEC 60958-3. The measurement bandwidth for audio jitter is typically 10 Hz to 20 kHz, with cumulative jitter below 1 ns peak-to-peak considered acceptable for consumer equipment and below 200 ps for professional equipment.
Jitter tolerance testing involves applying a digital signal with controlled amounts of sinusoidal jitter at various modulation frequencies (typically 100 Hz to 40 kHz) and measuring the resulting THD+N at the analog output. The jitter amplitude is increased until the THD+N degrades by a specified amount (typically 0.5 dB or 1 dB), establishing the jitter tolerance curve.
Successful audio equipment design per IEC 61606-3 requires attention to several critical areas:
Output Stage Design: The analog output stage after the DAC must provide adequate drive capability, low output impedance, and clean frequency response. Class A output stages, while less efficient, offer inherently lower crossover distortion. The standard’s THD+N measurement at −20 dBFS is particularly revealing of output stage linearity at typical listening levels.
Power Supply Decoupling: Clean, well-regulated power supplies are fundamental to achieving the low noise floors required by IEC 61606-3. Separate analog and digital supply rails, star grounding, and careful PCB layout — including ground plane segmentation and guard rings around sensitive analog sections — are essential practices.
Filter Design: The reconstruction filter (anti-imaging filter) following the DAC must provide adequate stopband attenuation while maintaining flat passband response. IEC 61606-3’s ±0.5 dB frequency response requirement demands careful filter design. Active filters using multiple-feedback (MFB) or Sallen-Key topologies with precision components (0.1% resistors, 1% capacitors) are commonly employed.
| Design Aspect | Critical Parameter | Common Pitfall | Best Practice |
|---|---|---|---|
| Output amplifier | THD+N at 1 kHz, −1 dBFS | Crossover distortion Class A/B | Class A biasing >50 mA idle current |
| Power supply | Noise floor 22 Hz–22 kHz | Digital noise coupling | Separate LDO regulators for analog |
| PCB layout | Channel separation > 90 dB | Ground loop crosstalk | Star ground, shielded traces |
| DAC selection | Dynamic range > 110 dB | Insufficient out-of-band noise filter | Multi-bit DAC with low noise shaping |