Physical Address
304 North Cardinal St.
Dorchester Center, MA 02124
Physical Address
304 North Cardinal St.
Dorchester Center, MA 02124
The Crow/AMSAA model posits that during reliability growth development testing, system failures follow a Non-Homogeneous Poisson Process with the following intensity function (instantaneous failure rate):
Here, λ is the scale parameter and β is the shape parameter — the single most important engineering metric in the model. When β < 1, the failure intensity decreases over time, which is the signature of genuine reliability growth. When β = 1, the process reduces to a homogeneous Poisson process (HPP) indicating no growth. When β > 1, reliability is actually degrading — a critical warning flag that demands immediate engineering intervention.
The expected cumulative number of failures by time t is given by:
This relationship yields a straight line on log-log coordinates, with slope β and intercept log(λ). This elegant linearity property makes the Crow/AMSAA model exceptionally well-suited for graphical validation of field data — a practitioner can visually assess whether the power-law assumption holds by simply plotting cumulative failures against cumulative test time on logarithmic scales.
The Crow/AMSAA model carries several important assumptions that engineers must validate before application:
Before estimating parameters, the engineer must first verify that a statistically significant growth trend exists. IEC 61164 recommends two complementary tests:
| Test | Statistic | Critical Value | Remarks |
|---|---|---|---|
| Laplace (Centered) | U = (Σtᵢ/T − m/2) / √(m/12) | ±1.96 (α=0.05) | U < 0 → growth; sensitive to early failures |
| Cramér–von Mises | C² = 1/(12m) + Σ[(tᵢ/T)^β − (2i−1)/(2m)]² | Tabulated IEC 61164 Annex | More robust; recommended for final confirmation |
| Military Handbook 189 | χ² = 2Σln(T/tᵢ) | χ² distribution, 2m d.o.f. | Equivalent to MLE-based test |
The Laplace test is particularly valuable as an initial screening tool due to its simplicity. However, it is notoriously sensitive to early-life failures — a cluster of failures in the first 10% of test time can dominate the statistic and produce a misleadingly strong “growth” signal even when later-stage growth is negligible.
For failure-truncated testing (test stops at the m-th failure), the MLE of β has a closed-form solution that is both elegant and computationally efficient:
where tᵢ is the i-th failure time and T is the total test duration. The MLE for λ follows directly: λ̂ = m / Tβ̂. These estimators are asymptotically unbiased, consistent, and efficient. Simulation studies have shown that stable estimates are typically achieved when m ≥ 20, though acceptable engineering precision can be obtained with as few as 10 to 15 failures when using bias-corrected estimators.
For time-truncated testing (test stops at a predetermined time T regardless of failure count), the MLE equations require numerical iteration. IEC 61164 provides explicit iterative algorithms using the Newton-Raphson method, along with starting value guidelines to ensure convergence.
The instantaneous MTBF at the end of test time T is estimated as:
Confidence intervals are constructed using the conditional chi-squared distribution property of the Crow/AMSAA model. The two-sided 90% confidence interval for the instantaneous MTBF is given by:
For the growth potential — the MTBF achievable if all identified failure modes are corrected — IEC 61164 provides an additional set of estimators that project the asymptotic reliability level assuming no new failure modes are introduced.
IEC 61164 Annex A provides a systematic framework for planning a reliability growth test based on the planned growth rate α, defined as:
The planning procedure follows these steps:
| Growth Rate α | Interpretation | Typical Context | Risk Level |
|---|---|---|---|
| 0.2 – 0.3 | Moderate growth | Mature technology, minor modifications | Low |
| 0.3 – 0.5 | Strong growth | New design with known technology base | Medium |
| 0.5 – 0.7 | Aggressive growth | Novel system with intensive TAAF cycles | High |
| > 0.7 | Extreme growth | Rarely sustainable; indicates overly conservative start MTBF | Very High |
The most effective application of IEC 61164 occurs within a structured Test-Analyze-And-Fix (TAAF) framework. Each TAAF cycle typically spans 2 to 4 weeks of continuous testing followed by 1 to 2 weeks of failure analysis and design modification. The Crow/AMSAA model is updated at the end of each cycle to provide quantitative feedback on whether the growth trajectory is on track.
IEC 61164 is one component of a comprehensive reliability engineering standards ecosystem. The Crow/AMSAA model outputs feed directly into:
A: The Duane model is an empirical graphical method that estimates growth by plotting cumulative MTBF against cumulative test time on log-log paper. It provides point estimates only — no confidence intervals, no goodness-of-fit tests, and no rigorous statistical foundation. The Crow/AMSAA model is mathematically equivalent to a stochastic process formulation of the Duane postulate but adds the full apparatus of statistical inference: MLE parameter estimation, chi-squared-based confidence bounds, Cramér–von Mises goodness-of-fit testing, and growth potential projections. For any formal reliability demonstration report, Crow/AMSAA is the required standard; Duane should be reserved for quick-look assessments during the early stages of testing.
A: IEC 61164 recommends pooling failure times from all units into a single ordered sequence, provided all units are operating under the same design iteration. If units are at different modification levels (e.g., Unit A has received Fix 1 while Unit B has not), the data must be handled using the “calibrated time” approach — mapping each unit’s test time onto a common developmental time axis. A simpler alternative is to analyze each unit separately and then combine the β estimates using a weighted average, with weights proportional to the number of failures per unit.
A: Terminating growth testing early carries significant risk, but objective criteria include: (1) The estimated instantaneous MTBF exceeds 130% of the target value; (2) The 90% upper confidence bound of β is below 0.7, indicating sustained strong growth; (3) Three consecutive TAAF cycles show no further decrease in β (growth saturation); (4) Total accumulated test time exceeds 10 times the target MTBF. Before final termination, a “no-fix verification run” of at least 1.5 times the target MTBF should be conducted to confirm stability. If no critical failures occur during this verification period, termination is justified.
A: Yes — the Crow/AMSAA model has been successfully applied to software reliability growth since the 1980s, particularly in defense avionics and mission-critical systems. However, practitioners must recognize key differences: (a) Software failures are design defects, not wear-out phenomena, so β carries a different physical interpretation related to defect discovery rate rather than hardware degradation; (b) Software corrections can introduce regression defects, violating the “perfect repair” assumption. Extended NHPP models (e.g., the Goel-Okumoto or delayed S-shaped models) may be more appropriate when the software development process follows a non-uniform defect introduction pattern. IEC 61164 is best applied to software growth at the system integration level where hardware and software failures are analyzed jointly.