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The IEC 11694 series provides a comprehensive framework for identification cards that employ optical memory technology. IEC 11694-2-14:2019 specifically addresses the physical dimensions and the precise location of the accessible optical area on cards using the linear recording method. This standard ensures interoperability among optical memory cards and reading devices, supporting applications such as healthcare, financial services, and secure access.
IEC 11694-2-14:2019 defines the dimensions, tolerances, and location of the accessible optical area for identification cards in ID-1 format (as per ISO/IEC 7810) that use optical memory with a linear recording technique. It covers the following aspects:
The standard applies to both card manufacturers and reader designers, providing a common reference for the optical region that must remain free of obstructions.
The standard mandates strict dimensional control to guarantee reliable reading. The following table summarises the key dimensional requirements defined in IEC 11694-2-14:2019.
| Parameter | Nominal Value | Tolerance | Notes |
|---|---|---|---|
| Card width | 85.60 mm | ±0.13 mm | As per ID-1 |
| Card height | 53.98 mm | ±0.16 mm | As per ID-1 |
| Card thickness | 0.76 mm | ±0.08 mm | Including optical layer |
| Optical area width | 54.0 mm | ±0.2 mm | Linear recording band |
| Optical area height | 32.0 mm | ±0.2 mm | Accessible vertical span |
| Optical area X offset (from left edge) | 15.8 mm | ±0.2 mm | Start of readable zone |
| Optical area Y offset (from top edge) | 11.0 mm | ±0.2 mm | Start of readable zone |
| Surface roughness (Ra) | ≤ 0.04 μm | – | To minimize scatter |
In addition to dimensions, the standard requires the optical area to be free of scratches, voids, or contamination larger than 5 μm. The card material must have a coefficient of linear thermal expansion less than 40×10−6 mm/mm/°C to maintain the optical area position under operating conditions (−10°C to 50°C).
Manufacturers should design card moulds with allowances for the defined X and Y offsets. The standard recommends that the optical area’s centre may be used as a reference for alignment in high-speed personalisation equipment. All critical dimensions must be measured on a minimum sample of 30 cards from each production lot to satisfy statistical process control requirements.
Compliance testing follows the procedures described in IEC 11694-2-14 Annex A and Annex B. Dimensional measurements are performed with a coordinate measuring machine (CMM) with a resolution of at least 1 μm. Optical area reflectivity and surface quality are verified using a calibrated optical profiler. Manufacturers are encouraged to engage an independent testing laboratory for type approval.
Environmental tests include exposure to 90% relative humidity at 40°C for 48 hours and a subsequent dimensional check. Cards must also withstand 1000 cycles of flexure and torsion without degrading the optical area.