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ASTM D4926‑20 provides a robust framework for estimating gamma alumina content in silica-alumina catalysts and catalyst carriers via X‑ray powder diffraction. By analyzing the characteristic diffraction peak at ~67 °2θ, this method allows analysts to quantify transition aluminas (including eta, chi, and gamma forms) generated in the 500–550 °C range.
The test procedure involves calcining and grinding a sample of the catalyst or catalyst carrier, followed by obtaining an X‑ray powder diffraction pattern over an angular range of approximately 52 to 76 °2θ. The diffracted intensity above the background for the peak occurring at about 67 °2θ is then compared to a reference sample, with necessary adjustments made for scale settings and peak half‑widths.
Gamma alumina is specifically defined in this standard as a transition alumina formed after heating in the range from 500 to 550 °C, which may include forms described in the literature as eta, chi, and gamma aluminas. The significance of this test lies in its ability to quantify an active or structural component of many industrial catalysts. However, careful judgment must be used when interpreting results due to potential interferences from other phases that share diffraction peaks in the same region.
To ensure consistency and reproducibility, the standard specifies precise instrument configurations. The X‑ray powder diffractometer unit must use Cu Kα radiation equipped with a monochromator, wide divergence and receiving slits, and appropriate scanning speeds.
| ⚙️ Parameter | 📏 Specification |
|---|---|
| Radiation | Cu Kα |
| Monochromator | Required |
| Divergence Slit | 3° |
| Receiving Slit | 0.15° |
| Goniometer Speed (Continuous) | 0.5 °/min |
| Scan Range | 52° to 76° 2θ |
| Chart Speed | ~0.5 cm/min |
| Step Size (Step Scanning) | 0.02° |
| Counting Time (Step Scanning) | 2.4 s/
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