Physical Address
304 North Cardinal St.
Dorchester Center, MA 02124
Physical Address
304 North Cardinal St.
Dorchester Center, MA 02124
ASTM D4410-16 provides standardized terminology for fluvial sediment, essential for professionals in sedimentation and hydrologic processes. It ensures consistent communication in water and land resource management.
This standard is applicable to persons involved in collecting, reporting, and interpreting sedimentation information. It references ASTM standards such as D5614 for open channel flow measurement and D7937 for in-situ turbidity measurement. All values are specified in SI units.
This section defines key processes. Accelerated erosion occurs at rates exceeding natural erosion, often due to anthropogenic activities. Accretion is sediment accumulation, while aggradation involves raising stream beds by deposition. Alluvial streams have boundaries composed of transported sediments.
| 🟦 Term | 📏 Definition |
|---|---|
| Accelerated erosion | Erosion at a rate greater than natural erosion, typically from human activities. |
| Aggradation | Geologic process of raising water body elevations by deposition. |
| Antidunes | Bed forms at high velocities moving upstream with water surface waves. |
| Attenuation | Light scattering and absorption measured at 180° relative to the incident beam. |
Terms from D7937 include ambient light, which is light not originating from the turbidimeter source, and attenuation, which is the reduction of incident light through scattering and absorption. These are critical for accurate turbidity testing below 1 NTU as per D7937.
Aggradation is the elevation of channel beds through deposition, while accretion is the general process of sediment accumulation.
It is erosion at a rate greater than geologic erosion, usually from human activities that reduce plant cover.
Antidunes occur at velocities higher than those forming dunes, commonly moving upstream with surface wave correlations.
Ambient light can interfere with turbidity readings since it does not come from the instrument source, leading to measurement errors.